题目：Scanning Probe Microscopy Based Spectroscopy Measurement for Nanoscale Chemical Identification
报告人：苏全民 研究员，Bruker Nano, 112 Robin Hill Road, Santa Barbara, CA 93003
Scanning probe microscopy has been instrumental for physical property characterizations at the nanometer scale, primarily for mechanical, electromagnetic and thermal properties. Recent progresses were focused on chemical identification based on mid-IR spectroscopy, pushing FTIR mapping to a resolution at or beyond 10 nm. This presentation will review technology advances in both scanning near field optical microscopy and photothermal based IR spectroscopy. Each of the techniques is discussed and benchmarked by detection limit, spatial resolution and signal to noise ratio, which ultimately determines the chemical mapping efficiencies. We will highlight techniques that address correlative imaging where physical and chemical properties at the same nanoscale location being acquired either concurrently or sequentially. As an example, PeakForce tapping based chemical and physical measurements will be explained in detail with the applications ranging from 2D materials to complex polymer complexes. The presentation will also highlight major challenges and key breakthrough needed for scanning probe based measurements to be broadly adopted as the premier tool for nanoscale chemical fingerprint mapping.