【学术报告】Nanoscale Infrared Microscopy with sub 10 nm Spatial Resolution

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  • 星期四
  • 12 月14日

报告题目:Nanoscale Infrared Microscopy with sub 10 nm Spatial Resolution
报告人:  Dr. Xiaoji G. Xu
          Lehigh University, USA
时间:    12月14日(周四)下午3:00
地点:    化学楼二楼会议室(234)

以下是报告的摘要部分,附件是报告人的简介部分:

Abstract:
    While Abbe’s optical diffraction limit prevents nanometer-scale spatial resolution for conventional microscopy and spectroscopy, the combination of optics and scanning probe microscopy provides a way to bypass the diffraction limit. One type of imaging technique is to utilize the near-field light scattering from a metallic AFM tip to locally probe the optical properties of the sample. The other type of high spatial resolution imaging technique is to measure the light-induced thermal expansions in the sample and related that to the local optical or infrared absorption. In the presentation, I will first describe our recent development of the scattering-type infrared near-field microscopy for three-dimensional mapping of near-field responses and a route to incorporate scattering-type infrared near-field microscopy with ultrafast lasers.1-2 Then, I will present our latest invention of peak force infrared (PFIR) microscopy3 that provides infrared imaging, broadband spectroscopy, and mechanical property mapping at a spatial resolution as high as 6 nm. In the end, I will describe applications of PFIR microscopy on the characterization of urban aerosols (particulate matter PM2.5)4 as well as the characterization of biological samples. The exploration of nanoscale phenomena will be facilitated by these nanoscale infrared imaging techniques in revealing hidden secrets of the nanoworld.

欢迎有兴趣的老师和同学参加!

固体表面物理化学国家重点实验室
化学化工学院
2017年12月7日